Lightscline

REAL-TIME INDUSTRIAL AI

Turn raw machine waveforms into operational decisions—on site.

Lightscline identifies machine faults from 5–10% of intelligently selected sensor data—running 400× more efficiently and up to 1,000× faster on edge compute.

Scaling On-Site Machine Intelligence

Legacy loop

Mean time to effect: Months

Full sensor streamEvery point leaves the machine
100% RAW DATA
REMOTE
Cloud transferMove every sample
IT infrastructureStore + compute
Data preparationAnalyst time
Unused shopfloor dataLegacy infra not scalable

On-site loop

Mean time to effect: Seconds to minutes

REAL TIME
Relevant signalDomain-aware selection
5–10% RELEVANT DATA
Physics-aware faults · 400× efficient · 1,000× faster
Continuous improvementSense Decide Act Learn
REPLICATE THE LOCAL LOOP
MachineIntelligent
CellCoordinated
FactoryAdaptive

Asset waveforms to operational decision in real-time on-site

Lightscline works directly with high-frequency waveforms to reduce data burden while preserving the signatures needed for diagnosis and prediction.

01 · SELECT

Find the fraction that carries the signal.

Smart sampling identifies the 5–10% of waveform data that matters before unnecessary processing propagates through the stack.

02 · UNDERSTAND

Learn the physics behind the condition.

Compact representations distinguish fault mechanisms, progression and remaining useful life—not only binary anomaly flags.

03 · ACT

Run the decision where the signal is generated.

Efficient models make near-real-time inference feasible on constrained on-site and edge hardware.

VALIDATED ON MACHINE PHYSICS

Different faults leave different signatures.

Lightscline learns compact representations that distinguish normal operation from multiple bearing-fault mechanisms.

Normal
Normal frequency spectrum

Selected signature: Normal

EDGE-COMPUTE PROOF

Less data makes deployment feasible on constrained hardware.

Smart sampling reduces training and transfer-learning time across Jetson Nano and Intel systems.

Comparison of edge training time using reduced sensor data
Edge training time by device and sampled-data fraction

PEER-REVIEWED PROOF

Efficiency that reaches the edge.

Published Scientific Reports benchmarks showed up to a 435× reduction in FLOPs versus a conventional CNN, with compact inference demonstrated on a Raspberry Pi Pico with 264 KB of RAM.

Discuss your application ↗

START WITH ONE MACHINE

Build the first tight operational loop in your factory.

Book a demo ↗